Surface Profile Measurement During Turning Using Fringe-Field Capacitive Profilometry

[+] Author and Article Information
J. L. Garbini, Sih-Ping Koh, Jens E. Jorgensen, Mamidala Ramulu

Department of Mechanical Engineering, University of Washington, Seattle, Wash. 98195

J. Dyn. Sys., Meas., Control 114(2), 234-243 (Jun 01, 1992) (10 pages) doi:10.1115/1.2896520 History: Received September 05, 1990; Revised July 01, 1991; Online March 17, 2008


The use of fringe-field capacitive sensing for surface profile measurement during the turning process is described. Measurements of the local surface height are inferred from variations in a fringe electric field induced between the sensing element and the workpiece. The surface profile is determined from high-speed scanning of the sensing element across the surface. The technique is particularly well-suited to the relatively harsh environment of in-process measurement. We have implemented a system in which profile measurements are made continuously, in real-time, and immediately adjacent to the cutting tool. The results of tests conducted to determine the accuracy and sensitivity of this capacitive profilometer are presented. In-process measurements of surfaces generated by turning with roughness in the range of 0.3 to 4.0 μm were made. Comparisons with static profile measurements made using standard stylus instrumentation are presented, and show quantitative agreement.

Copyright © 1992 by The American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.





Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In