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TECHNICAL PAPERS

Damage Detection Using Expanded Dynamic Residuals

[+] Author and Article Information
David C. Zimmerman

Department of Mechanical Engineering, University of Houston, Houston, TX 77204-4006

Hyoung M. Kim, Theodore J. Bartkowicz, Mohamed Kaouk

The Boeing Company, Houston, TX

J. Dyn. Sys., Meas., Control 123(4), 699-705 (Dec 25, 2000) (7 pages) doi:10.1115/1.1410932 History: Received December 25, 2000
Copyright © 2001 by ASME
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Figures

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NASA 8-bay damage cases, node numbers and reduced sensor Set 1
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NASA 8-bay case C damage vectors using expanded dynamic residuals (a) least-squares residual value (Eq. (18)), (b) number of occurrences of DOF in top 10 identified columns, (c) weighted column count, (d) estimate of full damage vector
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NASA 8-Bay case C damage vectors using past approaches (a) using all measurements and (b) guyan reduction of model to test DOFs, (c) dynamic expansion of test modes to full model size, (d) experimental orthogonal procrustes expansion of test modes to full model size
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Additional reduced sensor sets (a) sensor set 2-16 sensors, (b) sensor set 3-5 sensors chosen to maintain linear independence in measured modes
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NASA 8-bay case H damage vectors using expanded dynamic residuals and (a) all available measurements, sensor sets (b) 1, (c) 2, (d) 3
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NASA 8-Bay case D damage vectors using expanded dynamic residuals and (a) all available measurements, sensor sets (b) 1, (c) 2, (d) 3
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NASA 8-Bay case J damage vectors using expanded dynamic residuals and (a) all available measurements, sensor sets (b) 1, (c) 2, (d) 3
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NASA 8-Bay case N damage vectors using expanded dynamic residuals and (a) all available measurements, sensor sets (b) 1, (c) 2, (d) 3
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NASA 8-Bay damage vectors using expanded dynamic residuals and sensor Set 3 for (a) case A, (b) case C, (c) case E, (d) case F
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NASA 8-bay damage vectors using expanded dynamic residuals and sensor Set 3 for (a) case G, (b) case I, (c) case K, (d) case L
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NASA 8-bay damage vectors using expanded dynamic residuals and sensor Set 3 for (a) case M, (b) case O, (c) case P

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