Research Papers

Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing

[+] Author and Article Information
Fathi H. Ghorbel

Department of Mechanical Engineering and Materials Science,
Rice University,
Houston, TX 77005

James B. Dabney

Department of Systems Engineering,
University of Houston—Clear Lake,
Houston, TX 77058

1Corresponding author.

Contributed by the Dynamic Systems Division of ASME for publication in the JOURNAL OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL. Manuscript received December 7, 2009; final manuscript received February 21, 2012; published online October 30, 2012. Assoc. Editor: Nader Jalili.

J. Dyn. Sys., Meas., Control 135(1), 011002 (Oct 30, 2012) (6 pages) Paper No: DS-09-1341; doi: 10.1115/1.4006370 History: Received December 07, 2009; Revised February 21, 2012

The use of the atomic force microscope (AFM) as a tool to manipulate matter at the nanoscale has received a large amount of research interest in the last decade. Experimental and theoretical investigations have showed that the AFM cantilever can be used to push, cut, or pull nanosamples. However, AFM-based nanomanipulation suffers a lack of repeatability and controllability because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In this paper, we will investigate the effects of the tip-sample interactions on nanopushing manipulation. We propose the use of an interaction model based on the Maugis–Dugdale contact mechanics. The efficacy of the proposed model to reproduce experimental observations is demonstrated via numerical simulations. In addition, the coupling between adhesion and friction at the nanoscale is analyzed.

© 2013 by ASME
Your Session has timed out. Please sign back in to continue.


Bhushan, B., ed., 2004, Springer Handbook of Nanotechnology, Springer, New York.
Chung, Y.-W., ed., 2012, Micro- and Nanoscale Phenomena in Tribology, CRC Press, Boca Raton, FL.
Cecil, J., Powell, D., and Vasquez, D., 2007, “Assembly and Manipulation of Micro Devices—A State of the Art Survey,” Rob. Comput. Integr. Manuf., 23, pp. 580–588. [CrossRef]
Eigler, D. M., and Schweizer, E. K., 1990, “Positioning Single Atoms With a Scanning Tunneling Microscope,” Nature, 344, pp. 524–526. [CrossRef]
Bartels, L., Meyer, G., and Rieder, K.-H., 1997, “Basic Steps of Lateral Manipulation of Single Atoms and Diatomic Clusters With a Scanning Tunneling Microscope Tip,” Phys. Rev. Lett., 79, pp. 697–700. [CrossRef]
Decossas, S., Mazen, F., Baron, T., Bremond, G., and Souifi, A., 2003, “Atomic Force Microscopy Nanomanipulation of Silicon Nanocrystals for Nanodevice Fabrication,” Nanotechnology, 14, pp. 1272–1278. [CrossRef]
Hansen, L. T., Kuhle, A., Sorensen, A. H., Bohr, J., and Lindelof, P. E., 1998, “A Technique for Positioning Nanoparticles Using an Atomic Force Microscope,” Nanotechnology, 9, pp. 337–342. [CrossRef]
Resch, R., Baur, C., Bugacov, A., Koel, B. E., Madhukar, A., Requicha, A. A. G., and Will, P., 1998, “Building and Manipulating Three-Dimensional and Linked Two-Dimensional Structures of Nanoparticles Using Scanning Force Microscopy,” ACS J. Surf. Colloids, 14, pp. 6613–6616. [CrossRef]
Decossas, S., Patrone, L., Bonnot, A., Comin, F., Derivaz, M., Barski, A., and Chevrier, J., 2003, “Nanomanipulation by Atomic Force Microscopy of Carbon Nanotubes on a Nanostructured Surface,” Surf. Sci., 543, pp. 57–62. [CrossRef]
Ammi, M., and Ferreira, A., “Haptically Generated Paths of an AFM-Based Nanomanipulator Using Potential Fields,” 2004 4th IEEE Conference on Nanotechnology. [CrossRef]
Hrouzek, M., 2005, “Feedback Control in an Atomic Force Microscope Used as a Nano-Manipulator,” Acta Polytech., 45(4), pp. 65–69. Available at http://ctn.cvut.cz/ap/download.php?id=76
Fotiadis, D., Scheuring, S., Muller, S. A., Engel, A., and Muller, D. J., 2002, “Imaging and Manipulation of Biological Structures With the AFM,” Micron, 33, pp. 385–397. [CrossRef] [PubMed]
Israelachvili, J., 1995, Intermolecular and Surface Forces, 2nd ed., Academic Press Limited, New York.
Schitter, G., Menold, P., Knapp, H. F., Allgower, F., and Stemmer, A., 2001, “High Performance Feedback for Fast Scanning Atomic Force Microscopes,” Rev. Sci. Instrum., 72(8), pp. 3320–3327. [CrossRef]
Stark, R. W., Schitter, G., and Stemmer, A., 2003, “Tuning the Interaction Forces in Tapping Mode Atomic Force Microscopy,” Phys. Rev. B, 68, p. 085401. [CrossRef]
Maugis, D., 2000, Contact, Adhesion, and Rupture of Elastic Solids, Springer, New York.
Maugis, D., 1992, “Adhesion of Spheres: The JKR-DMT Transition Using a Dugdale Model,” J. Colloid Interface Sci., 150, pp. 243–269. [CrossRef]
Lantz, M. A., O’Shea, S. J., and Welland, M. E., 1997, “Atomic-Force-Microscope Study of Contact Area and Friction on NbSe2,” Phys. Rev. B, 55(16), pp. 10776–10785. [CrossRef]
Bhushan, B., ed., 1999, Handbook of Micro/Nano Tribology, 2nd ed., CRC Press, Boca Raton, FL.
Zhang, X., Zhong, X., Meng, X., Yi, G., and Jia, J., 2012, “Adhesion and Friction Studies of Nano-Textured Surfaces Produced by Self-Assembling Au Nanoparticles on Silicon Wafers,” Tribol. Lett., 46, pp. 65–73. [CrossRef]
Chan, S., Neu, C., Komvopoulos, K., and Reddi, A., 2011, “Dependence of Nanoscale Friction and Adhesion Properties of Articular Cartilage on Contact Load,” J. Biomech., 44, pp. 1340–1345. [CrossRef] [PubMed]
Fujisawa, S., Sugawara, Y., Ito, S., Mishima, S., Okada, T., and Morita, S., 1993, “The Two-Dimentional Stick-Slip Phenomenon With Atomic Resolution,” Nanotechnology, 4, pp. 138–142. [CrossRef]
Fujisawa, S., Kishi, E., Sugawara, Y., and Morita, S., 1994, “Two-Dimensionally Discrete Friction on the NaF(100) Surface With the Lattice Periodicity,” Nanotechnology, 5, pp. 8–11. [CrossRef]
Zaghloul, U., Bhushan, B., Pons, P., Papaioannou, G. J., Coccetti, F., and Plana, R., 2011, “Nanoscale Characterization of Different Stiction Mechanisms in Electrostatically Driven MEMS Devices Based on Adhesion and Friction Measurements,” J. Colloid Interface Sci., 358, pp. 1–13. [CrossRef] [PubMed]
Xu, L., Ma, T.-B., Hu, Y.-Z., and Wang, H., 2011, “Vanishing Stick-Slip Friction in Few-Layer Graphenes: The Thickness Effect,” Nanotechnology, 22, p. 285708. [CrossRef] [PubMed]
Sasaki, N., Okamoto, H., and Itamura, N., 2011, “Model Simulation of Adhesion and Friction of Nano-Scale Brush,” J. Surf. Sci. Nanotechnol., 9, pp. 409–415. [CrossRef]
Landolsi, F., Ghorbel, F. H., and Dabney, J. B., 2007, “An AFM-Based Nanomanipulation Model Describing the Atomic Two Dimensional Stick-Slip Behavior,” Proceedings of the 2007 ASME International Mechanical Engineering Congress and Exposition, Seattle, WA, Nov. 11–15. [CrossRef]
Landolsi, F., Ghorbel, F. H., Lou, J., Lu, H., and Sun, Y., 2009, “Nanoscale Friction Dynamic Modeling,” ASME J. Dyn. Sys., Meas., Control, 131, p. 061102. [CrossRef]
Landolsi, F., Sun, Y., Lu, H., Ghorbel, F. H., and Lou, J., “Regular and Reverse Nanoscale Stick-Slip Behavior: Modeling and Experiments,” Appl. Surf. Sci., 256, pp. 2577–2582. [CrossRef]
Haessig, D. A., and Friedland, B., 1991, “On the Modeling and Simulation of Friction,” ASME J. Dyn. Sys. Meas. Control, 113, pp. 354–362. [CrossRef]
Canudas de Wit, C., Olsson, H., Astrom, K. J., and Lischinsky, P., 1995, “A New Model for Control of Systems With Friction,” IEEE Trans. Autom. Control, 40(3), pp. 419–425. [CrossRef]
Fujisawa, S., Kishi, E., Sugawara, Y., and Morita, S., 1995, “Load Dependence of Two Dimensional Atomic Scale Friction,” Phys. Rev. B, 52(7), pp. 5302–5305. [CrossRef]
Fujisawa, S., Kishi, E., Sugawara, Y., and Morita, S., 1995, “Atomic-Scale Friction Observed With a Two-Dimensional Frictional-Force Microscope,” Phys. Rev. B, 51(12), pp. 7849–7857. [CrossRef]
Kerssemakers, J., and de Hosson, J. T. M., 1996, “Influence of Spring Stiffness and Anisotropy on Stick-Slip Atomic Force Microscopy Imaging,” J. Appl. Phys., 80(2), pp. 623–631. [CrossRef]
Morita, S., Fujisawa, S., and Sugawara, Y., 1996, “Spatially Quantized Friction With a Lattice Periodicity,” Surf. Sci. Rep., 23, pp. 1–41. [CrossRef]
Marton, L., and Lantos, B., 2006, “Identification and Model-Based Compensation of Striebeck Friction,” Acta Polytech. Hungar., 3(3), pp. 45–58. Available at http://www.uni-obuda.hu/journal/Marton_Lantos_7.pdf
Mueller-Hoeppe, D., Loehnert, S., and Reese, S., eds., 2011, Recent Developments and Innovative Applications in Computational Mechanics, Springer, New York.
Tafazzoli, A., and Sitti, M., 2004, “Dynamic Behavior and Simulation of Nanoparticle Sliding During Nanoprobe-Based Positioning,” Proceedings of the ASME International Mechanical Engineering Congress, Anaheim, CA, Nov. 13–19. [CrossRef]
Tafazzoli, A., Pawashe, C., and Sitti, M., 2005, “Atomic Force Microscope Based Two-Dimensional Assembly of Micro/Nanoparticles,” Assembly and Task Planning: From Nano to Macro Assembly and Manufacturing, The 6th IEEE International Symposium, July 19–21, pp. 230–235. [CrossRef]
Zhou, Q., Kallio, P., Arai, F., Fukuda, T., and Koivoc, H. N., 1999, “A Model for Operating Spherical Micro Objects,” International Symposium on Micromechatronics and Human Science.
Garcia, R., and San Paulo, A., 2000, “Dynamics of a Vibrating Tip Near or in Intermittent Contact With a Surface,” Phys. Rev. B, 61(20), pp. R13381–R13384. [CrossRef]
Junno, T., Deppert, K., Montelius, L., and Samuelson, L., 1995, “Controlled Manipulation of Nanoparticles With an Atomic Force Microscope,” Appl. Phys. Lett., 66(26), pp. 3627–3629. [CrossRef]
Gnecco, E., Bennewitz, R., Gyalog, T., and Meyer, E., 2001, “Friction Experiments on the Nanometre Scale,” J. Phys.: Condens. Matter, 13, pp. R619–R642. [CrossRef]


Grahic Jump Location
Fig. 1

AFM-based nanopushing manipulation

Grahic Jump Location
Fig. 2

Domain of action of the adhesion force

Grahic Jump Location
Fig. 3

Block diagram of the proposed nanomanipulation model

Grahic Jump Location
Fig. 4

Relation between I¯c and Δ¯ for various λ

Grahic Jump Location
Fig. 5

Effect of varying the tip radius on simulated FFM scans of the same sample (a) Rt=100×10-9m and (b) Rt=200×10-9m

Grahic Jump Location
Fig. 6

Convolution effect (a) big tip radius and (b) small tip radius

Grahic Jump Location
Fig. 7

Effect of adhesion on sample motion

Grahic Jump Location
Fig. 8

Effect of adhesion on tip motion

Grahic Jump Location
Fig. 9

Effect of adhesion on nanoscale friction

Grahic Jump Location
Fig. 10

Effect of adhesion on the sticking positions of the sample

Grahic Jump Location
Fig. 11

Microsliding phenomenon



Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In