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Run-to-Run Optimization Control within Exact Inverse Framework for Scan Tracking

[+] Author and Article Information
Ivan L. Yeoh

Department of Mechanical Engineering, University of Washington
ivanyeoh@uw.edu

Per G. Reinhall

Department of Mechanical Engineering, University of Washington
reinhall@uw.edu

Martin C. Berg

Department of Mechanical Engineering, University of Washington
berg@uw.edu

Howard J. Chizeck

Department of Electrical Engineering, University of Washington Seattle, WA 98195
chizeck@uw.edu

Eric J. Seibel

Department of Mechanical Engineering, University of Washington
eseibel@u.washington.edu

1Corresponding author.

ASME doi:10.1115/1.4036231 History: Received June 07, 2016; Revised February 11, 2017

Abstract

A run-to-run optimization controller uses a reduced set of measurement parameters, in comparison to more general feedback controllers, to converge to the best control point for a repetitive process. A new run-to-run optimization controller is presented for the scanning fiber device used for image acquisition and display. This controller utilizes very sparse measurements to estimate a system energy measure and updates the input parameterizations iteratively within a feedforward with exact-inversion framework. Analysis, simulation and experimental investigations on the scanning fiber device demonstrate improved scan accuracy over previous methods and automatic controller adaptation to changing operating temperature. A specific application example and quantitative error analyses are provided of a scanning fiber endoscope that maintains high image quality continuously across a 20°C temperature rise without interruption of the 56 Hz video.

Copyright (c) 2017 by ASME
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