Run-to-Run Optimization Control within Exact Inverse Framework for Scan Tracking

[+] Author and Article Information
Ivan L. Yeoh

Department of Mechanical Engineering, University of Washington

Per G. Reinhall

Department of Mechanical Engineering, University of Washington

Martin C. Berg

Department of Mechanical Engineering, University of Washington

Howard J. Chizeck

Department of Electrical Engineering, University of Washington Seattle, WA 98195

Eric J. Seibel

Department of Mechanical Engineering, University of Washington

1Corresponding author.

ASME doi:10.1115/1.4036231 History: Received June 07, 2016; Revised February 11, 2017


A run-to-run optimization controller uses a reduced set of measurement parameters, in comparison to more general feedback controllers, to converge to the best control point for a repetitive process. A new run-to-run optimization controller is presented for the scanning fiber device used for image acquisition and display. This controller utilizes very sparse measurements to estimate a system energy measure and updates the input parameterizations iteratively within a feedforward with exact-inversion framework. Analysis, simulation and experimental investigations on the scanning fiber device demonstrate improved scan accuracy over previous methods and automatic controller adaptation to changing operating temperature. A specific application example and quantitative error analyses are provided of a scanning fiber endoscope that maintains high image quality continuously across a 20°C temperature rise without interruption of the 56 Hz video.

Copyright (c) 2017 by ASME
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