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Research Papers

Calibration and Compensation of Dynamic Abbe Errors of a Coordinate Measuring Machine

[+] Author and Article Information
Daocheng Yuan

Institute of Machinery
Manufacturing Technology,
China Academy of Engineering Physics,
Mianyang, Sichuan 621000, China;
School of Mechanical Engineering,
Xi'an Jiaotong University,
Xi'an 710049, China
e-mail: 18608160633@wo.cn

Xin Tao

Institute of Machinery
Manufacturing Technology,
China Academy of Engineering Physics,
Mianyang, Sichuan 621000, China
e-mail: cztaoxin@foxmail.com

Caijun Xie

Institute of Machinery Manufacturing
Technology,
China Academy of Engineering Physics,
Mianyang, Sichuan 621000, China
e-mail: xxx_2011@yeah.net

Huiying Zhao

School of Mechanical Engineering,
Xi'an Jiaotong University,
Xi'an 710049, China
e-mail: zhaohuiying@mail.xjtu.edu.cn

Dongxu Ren

School of Mechanical Engineering,
Xi'an Jiaotong University,
Xi'an 710049, China
e-mail: rendongxu313@126.com

Xueliang Zhu

School of Mechanical Engineering,
Xi'an Jiaotong University,
Xi'an 710049, China
e-mail: xueliang.zhu@foxmail.com

1Corresponding author.

Contributed by the Dynamic Systems Division of ASME for publication in the JOURNAL OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL. Manuscript received September 15, 2016; final manuscript received September 30, 2017; published online December 19, 2017. Assoc. Editor: Davide Spinello.

J. Dyn. Sys., Meas., Control 140(5), 051001 (Dec 19, 2017) (9 pages) Paper No: DS-16-1444; doi: 10.1115/1.4038171 History: Received September 15, 2016; Revised September 30, 2017

Error compensation technology is used for improving accuracy and reducing costs. Dynamic error compensation techniques of coordinate measuring machine (CMM) are still under study; the major problem is a lack of suitable models, which would be able to correctly and simply relate the dynamic errors with the structural and operational parameters. To avoid the complexity of local dynamic deformation measurement and modeling, a comprehensive calibration method is employed. Experimental research reveals specific qualities of dynamic Abbe errors; the results exceed the scope of ISO 10360-2 calibration method, showing the ISO 10360-2 dynamic error evaluation deficiencies. For calibrating the dynamic Abbe errors, the differential measurement method is presented based on the measurements of the internal and external dimensions. Referring probe tip radius correction, the dynamic Abbe errors compensation method is proposed for CMM end-users and is easy to use.

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References

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Figures

Grahic Jump Location
Fig. 1

Dynamic Abbe error caused by rotation errors of X carriage

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Fig. 2

Outer and inner length with dynamic Abbe errors

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Fig. 3

Outside and inside length artifact

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Fig. 4

Schematic of the test positions of artifact in the xy plane of CMM

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Fig. 5

Measurement error versus Abbe offset (Y position): (a) θxo = 0.158″, (b) θxo = 0.152″, (c) θxo = 0.163″, (d)θxo = 0.152″, (e) θxo = 0.143″, and (f) θxo = 0.160″. (a)–(c) Probe calibration position is X = 450 and Abbe offset = 900. (d)–(f) Probe calibration position is X = 450 and Abbe offset = 300. θxo is dynamic error angle corresponding to operating parameters (speed, etc.), under the formula (3).

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Fig. 6

Measurement error versus X position. Probe calibration position is X = 450 and Abbe offset = 900.

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Fig. 7

Outside and inside length changes versus measuring speed and force: (a) Abbe offset = 350, (b) Abbe offset = 350, (c)Abbe offset = 950, (d) Abbe offset = 950, (e) Abbe offset = 350, (f) Abbe offset = 350, (g) Abbe offset = 950, and (h) Abbe offset = 950

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Fig. 8

Schematic of varying Abbe offset with YZ

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Fig. 9

Schematic of the relation between dynamic Abbe error signs and moving direction: (a) measurement of outer length and (b) measurement of inner length. Notes: Dots indicate the actual measurement position, and arrows show the moving direction of the measurement.

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Fig. 10

Dynamic Abbe error compensation based on the probe radius compensation (−Xmotion)

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Fig. 11

Measurement error after compensation versus Abbe offset (Y position). (a)–(c) Probe calibration position is X = 450 and Abbe offset = 900, (d)–(f) probe calibration position is X = 450 and Abbe offset = 600, and (g)–(i) probe calibration position is X = 450 and Abbe offset = 300.

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